Flexible Electronics News

Applied Materials Unveils ‘Playbook’ for Process Control Based on Big Data, AI

Enlight optical wafer inspection system combines breakthrough performance with new optics that capture more yield data from every wafer, the company said.

Author Image

By: Anthony Locicero

Copy editor, New York Post

Applied Materials, Inc. unveiled an innovation in process control that the company said uses Big Data and AI technology to help semiconductor manufacturers accelerate node development, speed time to revenue and earn more profits over the life of a node.   Semiconductor technology is becoming increasingly complex and expensive, and reducing the time needed to develop and ramp advanced nodes can be worth billions of dollars to chipmakers around the world, according to Applied Materials.   ...

Continue reading this story and get 24/7 access to Ink World magazine for FREE


Already a subscriber? Sign in

Keep Up With Our Content. Subscribe To Ink World magazine Newsletters